1951 |
|
Minato Tsushinki Seisakusho was established in Minato-ku, Tokyo to design and manufacture electronic measruing instruments, power supply equipment. |
1956 |
|
Minato Tsushinki Seisakusho was re-organized and incorporated as Minato Tsushinki Co., Ltd. |
1962 |
April |
Takasaki Factory was constructed in Takasaki-shi, Gunma Prefecture. |
1966 |
|
The first IC tester, "Integrated Circuit Function Tester" was developed. |
1966 |
|
Yokohama Factory was constructed in Yokohama-shi. |
1968 |
|
Memory Function Tester was developed. |
1972 |
|
Company name was changed to Minato Electronics Inc. |
1973 |
|
Japan's very first "Prom Programmer" was developed |
1980 |
|
Memory test system was developed.
|
1981 |
August |
Head office was moved to the present address of Yokohama-shi. |
1984 |
|
Virtual Server connecting different PC through LAN was developed. |
1984 |
|
Optical touch sensor system, Touch Data was developed. |
1986 |
Feburary |
CCD Test System and Non-Contact type Velocity, Rotational Speed Variation Measuring Instrument utilizing laser and doppler effects were developed. |
1988 |
November |
Registered and Listed in JASDAQ |
1991 |
November |
LCD test system was developed. |
1994 |
|
Flash Memory test system was developed. |
1997 |
November |
Test Burn-In System was developed. |
1999 |
November |
Gang Programmer 16pcs simultaneously was developed. |
2001 |
March |
FPD High Precision Test System was developed. |
2002 |
March |
High Speed Auto Handler for Gang Programmer was developed. |
2002 |
|
Plasma Touch (Super Large Touch Panel) was developed. |
2002 |
August |
Gang Programmer 8pcs simultaneously was developed. |
2004 |
|
ISO 140001 certification was granted. |
2005 |
October |
Gang Programmer with MPG engine 16pcs simultaneously was developed. |
2010 |
July |
Concurrent Gang Programmer was developed. |
2011 |
May |
Takasaki Factory was integrated at the Head office. |
